Progress made on New Dielectric Test Method

At IPC Midwest, the D-24c High Speed/High Frequency Task Group broke through another barrier to supply chain inefficiency with a presentation on new research for finding a common industry methodology for measurement of dielectric constant and loss. D-24 Subcommittee Chair Don DeGroot explains it in this video interview with pcb007.com’s Ray Rasmussen.

DeGroot points out that, while customers and suppliers may have their own ways of calculating dielectric constant, having a standardized IPC methodology will allow for better benchmarking of such attributes as frequency, classes of material types, and standardized test structures that are similar to practical signal traces.

Watch the interview here.

D-24C Committee Home page includes DeGroot’s presentation under Minutes.

More RealTime with IPC Midwest video interviews of Committee Chairs.

3 Comments

  1. Posted February 15, 2010 at 8:28 am | Permalink

    still later that day I encountered a case where it would be very very useful. It’s a nice way to pass around objects even if you don’t ‘have’ one. Better than making object parameters optional all over the code imho…

  2. Posted February 15, 2010 at 8:36 am | Permalink

    DeGroot points out that, while customers and suppliers may have their own ways of calculating dielectric constant, having a standardized IPC methodology will allow for better benchmarking of such attributes as frequency, classes of material types, and standardized test structures that are similar to practical signal traces.

  3. ubysamantha
    Posted November 25, 2011 at 10:26 am | Permalink

    excellent article THANKS


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